Electron Microscopy and Spectroscopy

OBJECTIVES AND SPECIFICATIONS:
– Imaging and analysis on atomic and molecular level using cutting-edge technology.
– Turkey’s first high resolution analytic transmission electron microscope for imaging and analysis at atomic scale.
– Slice/view (ion milling-SEM imaging) applications for 3D analysis of organic and inorganic materials.
– Structuring, TEM specimen preparation using FIB milling.
– EDS spectral and mapping analysis for determining elementer/chemical distribution in materials.

AREAS OF IMPACT AND APPLICATIONS:
Nanostructering nanopatterning surface functionalization and nano-prototyping using focused electron and ion beams.

EQUIPMENT LIST
– JEOL JEM-ARM200CFEG UHR-TEM (equipped with STEM, Cs corrected STEM, EDS, Gatan Quantum GIF and Digital CCD Camera)
– JEOL JIB-4601F MultiBeam FIB-SEM system (equipped with Oxford Omniprobe Micromanipulator and Gas Injection System (C-GIS); Oxford Xmax-N EDS System)
– RMC Model PT-PC Cryo-Ultramicrotome System attached with CRX Universal Cryosectioning System and Diatome Model 24-CDL Dry Cryo Diamond Knife
– Cressington 108 Metal and Carbon Sputter Coaters