Electron Microscopy and Spectroscopy

OBJECTIVES AND SPECIFICATIONS:
– Imaging and analysis on atomic and molecular level using cutting-edge technology
– Turkey’s first high resolution analytic transmission electron microscope for imaging and analysis at atomic scale
– Slice/view (ion milling-SEM imaging) applications for 3D analysis of organic and inorganic materials
– Structuring, TEM specimen preparation using FIB milling
– EDS spectral and mapping analysis for determining elementer/chemical distribution in materials

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AREAS OF IMPACT AND APPLICATIONS:
Nanostructering nanopatterning surface functionalization and nano-prototyping using focused electron and ion beams

EQUIPMENT LIST


– JEOL JEM-ARM200CFEG UHR-TEM (equipped with STEM, Cs corrected STEM, EDS, Gatan Quantum GIF and Digital CCD Camera)
– JEOL JIB-4601F MultiBeam FIB-SEM system (equipped with Oxford omniprobe, GIS (C, Pt) and RAITH Elphy Quantum FIB/SEM Nanolithography Systems)
– JEOL JEM-1400 (ST-FC) HC-HR-TEM (equipped with EDS and STEM)
– JEOL JSM-7800F FEG-SEM (equipped with EDS and EBSD Systems)

– RMC Model PT-PC Cryo-Ultramicrotome System
– CRX Universal Cryosectioning System
– Diatome Model 24-CDL Dry Cryo Diamond Knife
– Cressington 108 metal and carbon sputter coaters