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Electron Microscopy and Spectroscopy

Infrastructure

Home > Infrastructure > Laboratories > Measurement, Characterization / Imaging > Electron Microscopy and Spectroscopy

OBJECTIVES AND SPECIFICATIONS

  • Imaging and analysis on atomic and molecular level using cutting-edge technology.
  • Turkey’s first high resolution analytic transmission electron microscope for imaging and analysis at atomic scale.
  • Slice/view (ion milling-SEM imaging) applications for 3D analysis of organic and inorganic materials.
  • Structuring, TEM specimen preparation using FIB milling.
  • EDS spectral and mapping analysis for determining elementer/chemical distribution in materials.

AREAS OF IMPACT AND APPLICATIONS

  • Nanostructering nanopatterning surface functionalization and nano-prototyping using focused electron and ion beams.

EQUIPMENT LIST

  • JEOL JEM-ARM200CFEG UHR-TEM (equipped with STEM, Cs corrected STEM, EDS, Gatan Quantum GIF and Digital CCD Camera)
  • JEOL JIB-4601F MultiBeam FIB-SEM system (equipped with Oxford Omniprobe Micromanipulator and Gas Injection System (C-GIS); Oxford Xmax-N EDS System)
  • RMC Model PT-PC Cryo-Ultramicrotome System attached with CRX Universal Cryosectioning System and Diatome Model 24-CDL Dry Cryo Diamond Knife
  • Cressington 108 Metal and Carbon Sputter Coaters
Sabancı Sunum

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