On Thursday, August 6, 2026, the Fundamentals and Hands-on Training on Atomic Force Microscopy (AFM) was held at SUNUM as part of the TEAM-NANO Project. The training was organized for current users of the AFM devices and researchers planning to use these devices in their research. The training was delivered by Assoc. Prof. Ümit Çelik from Fırat University.
During the theoretical and hands-on training, participants received comprehensive information on the fundamental operating principles of AFM, the principles of its different measurement modes, and its main application areas. The training covered the fundamental operating mechanism of AFM, probe–sample interactions, and the principles of surface topography acquisition. Participants were also introduced to the theoretical principles of contact, non-contact, and dynamic imaging modes, as well as advanced AFM modes used for electrical, piezoelectric, and surface potential characterization.
In the hands-on session, contact mode measurements were performed on gold and platinum surfaces. Participants were guided through sample mounting, probe and laser alignment, the selection of appropriate scanning parameters, the acquisition of topographical images, and the basic steps of data analysis.
This workshop was organized within the scope of the Horizon Europe Teaming for Excellence – TEAM-NANO Project, with the aim of enhancing the effective use of SUNUM’s advanced nano-characterization infrastructure, strengthening researchers’ technical competencies, and further improving the center’s internationally competitive research and service capacity.
Funded by the European Union under the Horizon Europe Program, Grant No: 101136388.
For more detailed information about TEAM-NANO: https://teamnano.net/
For our Fabrication/Test/Analysis Services List: https://sunum.sabanciuniv.edu/en/infrasturcture/service-fees
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