Bringing together the meaning of April 23rd National Sovereignty and Children's Day and the power of technology, this special visual was created at Sabancı University Nanotechnology Research and Application Center (SUNUM) using the JEOL JIB-4601F Focused Ion Beam-Scanning Electron Microscope (FIB-SEM) system.
The figure of a child, with the Turkish flag waving beside it and nanoscale structures, brings science and design together on the same ground and pays homage to April 23rd.
This image was prepared by precisely etching the silicon wafer surface with focused ions and then imaged with high-resolution SEM on the same platform.
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