We attended the 26th National Electron Microscopy Congress.

We attended the 26th National Electron Microscopy Congress.

As SUNUM, we participated in the 26th National Electron Microscopy Congress, which aims to bring "microscopists" together to share their work and experiences. 

We gave information about SUNUM's infrastructure, services and online sales platform e-Store and answered the questions of the researchers attending the congress held at Eskişehir Technical University on September 20-23.

SUNUM part-time researcher Meltem Sezen Özkoç, presented a paper titled "Towards FocusedIon Beam (FIB) Processing of Soft Materials:Rubber Compounds and Biopolymer Nanocomposites" as guest speaker.