X-ray diffraction (XRD) device, which has thermally controlled stage for both cryogenic and heated measurements (between -180 °C and +1600 °C), continues to serve researchers to offer a powerful, non-destructive and rapid technique for characterizing crystalline materials.
XRD device is a widely preferred characterization method in different sectors, particularly geology, materials, environment, chemistry, forensic medicine and pharmaceutical sectors, as it provides qualitative and quantitative information about structural parameters of materials such as crystal structure, phase composition, residual stresses and crystal defects.
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