On Thursday, 26 February 2026, a theoretical and hands-on training session was organized for the JEOL ARM 200F Cold FEG Transmission Electron Microscope (TEM/STEM) available within the SUNUM infrastructure. The training, which was open to all current and potential users of the system, was delivered by Dr. Selçuk Birdoğan. Within the scope of the training, participants also had the opportunity to perform practical applications directly on the instrument.
The advanced Transmission Electron Microscopy (TEM/STEM) system available at SUNUM provides comprehensive analysis services for the structural and chemical characterization of nanomaterials. Within this framework, high-resolution imaging of nanoparticles, determination of their atomic structures, and investigation of their crystallographic properties can be performed. Crystal structure analyses are carried out using the Selected Area Electron Diffraction (SAED) technique, enabling phase identification and determination of crystal symmetry. In addition, Electron Energy Loss Spectroscopy (EELS) is used to enable highly sensitive analysis of light elements and/or elements present in trace amounts.
To determine the chemical composition and elements, chemical mapping can be performed using Energy-Filtered Transmission Electron Microscopy (EFTEM). In Scanning Transmission Electron Microscopy (STEM) mode, structural and morphological analyses are carried out using bright-field, low-angle annular dark-field (LAADF), and high-angle annular dark-field (HAADF) imaging techniques. Furthermore, an Energy Dispersive X-ray Spectroscopy (EDS) detector integrated into the STEM detector system enables elemental analysis and mapping with high spatial resolution.
Thanks to this multi-modal analysis infrastructure, the structural, crystallographic, and chemical characterization of materials at the atomic scale can be carried out through an integrated and comprehensive approach.
This workshop was organized within the scope of the Horizon Europe Teaming for Excellence – TEAM-NANO Project, with the aim of enhancing the effective use of SUNUM’s advanced nano-characterization infrastructure, strengthening researchers’ technical competencies, and further improving the center’s internationally competitive research and service capacity.
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